Prestigious Dubai Meeting Sees the Launch of Rugged, New Xrf Analyser for Demanding Elemental Analysis Conditions

Specialist distributors from across the Middle East gathered at the Jumeirah Hotel, Dubai for Oxford Instruments` (UK) highly successful launch meeting to announce their next generation, X-ray Fluorescence
(XRF) analyser, the X-MET5000 – the first truly rugged hand-held analyser for harsh multi-element analysis.
Engineered for high performance and reliability, this tough, brand new portable XRF analyser combines Oxford Instruments` patented PentaPIN® detector technology for guaranteed fast analysis and lower limits
of detection.
Built for the most demanding quality control applications such as scrap metal recycling, analysis of metals for PMI, screening for lead in toys and consumer product RoHS compliance testing - the X-MET5000 also serves the needs of the mining community for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring. The X-MET5000s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like Aluminium and Silicon. This is not possible when using Fundamental Parameters (FP) on an analyzer that does not detect the light elements.
This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection. The X-MET5000 is perfect for the harshest environments.
The battery`s operating time of one working day enables extended productivity. The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically choose the best analysis method. An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.