Analytical Instrumentation
New Silicon Drift Detector for EDXRF Elemental Analyser Enables Faster Analysis With Better Limits of Detection
Dec 11 2015
Designed to dramatically improve elemental analysis capabilities for a broad range of applications, the new SDD1000 detector for the Thermo Scientific (USA) ARL QUANT’X EDXRF spectrometer utilises a 1,000-micron silicon crystal, more than double the thickness of silicon drift detectors on the market. The multi-purpose ARL QUANT’X EDXRF (energy dispersive x-ray fluorescence) spectrometer fitted with the SDD1000 detector provides four times higher count rate and better resolution than the instrument’s previous detector, offering improved limits of detection and three times faster measurement. The thickness of the state-of-the-art silicon crystal provides enhanced sensitivity for the detection of heavy elements. Its larger active area provides better performance for lighter to heavier elements.
Digital Edition
PIN 25.2 Apr/May
May 2024
Safety - Carbon monoxide toxic and flammable gas detection Analytical Instrumentation - Density: A fundamental parameter at critical stages within the petroleum sector - Advancements and...
View all digital editions
Events
Jul 10 2024 Birmingham, UK
Thailand Oil & Gas Roadshow 2024
Jul 11 2024 Rayong, Thailand
Jul 20 2024 Denver, CO, USA
Jul 21 2024 Cape Town, South Africa
Jul 24 2024 Bogata, Colombia